Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994534 | Testing device for integrated circuit package | Shao-Chun Chiu, Wen-Feng Liao, Hao Chen | 2024-05-28 |
| 11604211 | Testing device and method for integrated circuit package | Shao-Chun Chiu, Wen-Feng Liao, Hao Chen | 2023-03-14 |
| 8146245 | Method for assembling a wafer level test probe card | Clinton Chao, Fei-Chieh Yang, Mill-Jer Wang, Sheng-Hsi Huang, Ming-Cheng Hsu | 2012-04-03 |
| 7750651 | Wafer level test probe card | Clinton Chao, Fei-Chieh Yang, Mill-Jer Wang, Sheng-Hsi Huang, Ming-Cheng Hsu | 2010-07-06 |