Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994534 | Testing device for integrated circuit package | Wen-Feng Liao, Hao Chen, Chun-Hsing Chen | 2024-05-28 |
| 11604211 | Testing device and method for integrated circuit package | Wen-Feng Liao, Hao Chen, Chun-Hsing Chen | 2023-03-14 |