Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994534 | Testing device for integrated circuit package | Shao-Chun Chiu, Hao Chen, Chun-Hsing Chen | 2024-05-28 |
| 11604211 | Testing device and method for integrated circuit package | Shao-Chun Chiu, Hao Chen, Chun-Hsing Chen | 2023-03-14 |
| 9535091 | Probe head, probe card assembly using the same, and manufacturing method thereof | Ming-Cheng Hsu, Wen-Tsai Su, Yuan Huang | 2017-01-03 |