Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8146245 | Method for assembling a wafer level test probe card | Clinton Chao, Fei-Chieh Yang, Chun-Hsing Chen, Mill-Jer Wang, Ming-Cheng Hsu | 2012-04-03 |
| 7750651 | Wafer level test probe card | Clinton Chao, Fei-Chieh Yang, Chun-Hsing Chen, Mill-Jer Wang, Ming-Cheng Hsu | 2010-07-06 |