CT

Chao-Chieh Tsai

TSMC: 23 patents #1,475 of 12,232Top 15%
📍 Taichung, CA: #49 of 193 inventorsTop 30%
Overall (All Time): #186,133 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
RE41668 Seal ring structure for radio frequency integrated circuits Shyh Chih Wong 2010-09-14
7265438 RF seal ring structure Shyh-Ch Wong 2007-09-04
7081648 Lossless co-planar wave guide in CMOS process 2006-07-25
7061056 High fMAX deep submicron MOSFET Shyh-Chyi Wong, Chung-Long Chang 2006-06-13
6967392 Seal ring structure for radio frequency integrated circuits Shih Chih Wong 2005-11-22
6646328 Chip antenna with a shielding layer 2003-11-11
6613623 High fMAX deep submicron MOSFET Shyh-Chyi Wong, Chung-Long Chang 2003-09-02
6537849 Seal ring structure for radio frequency integrated circuits Shih Chih Wong 2003-03-25
6521971 Metal fuse in copper dual damascene 2003-02-18
6376351 High Fmax RF MOSFET with embedded stack gate 2002-04-23
6303448 Method for fabricating raised source/drain structures Shou-Zen Chang 2001-10-16
6295721 Metal fuse in copper dual damascene 2001-10-02
6258688 Method to form a high Q inductor 2001-07-10
6245637 STI process 2001-06-12
6180445 Method to fabricate high Q inductor by redistribution layer when flip-chip package is employed 2001-01-30
6083824 Borderless contact Chin-Hsiung Ho, Yuan-Chen Sun 2000-07-04
6020255 Dual damascene interconnect process with borderless contact Chin-Hsiung Ho, Yuan-Chen Sun 2000-02-01
5982017 Recessed structure for shallow trench isolation and salicide processes Sheng-Jyh Wu, Jing-Meng Liu 1999-11-09
5891771 Recessed structure for shallow trench isolation and salicide process Sheng-Jyh Wu, Jing-Meng Liu 1999-04-06
5858854 Method for forming high contrast alignment marks Shun-Liang Hsu, Tsu Shih 1999-01-12
5858846 Salicide integration method Wen-Chen Lin, Liang Szuma 1999-01-12
5726091 Method of reducing bird's beak of field oxide using reoxidized nitrided pad oxide layer Shun-Liang Hsu 1998-03-10
5648287 Method of salicidation for deep quarter micron LDD MOSFET devices Shie-Sen Peng 1997-07-15