Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12187943 | Chemical solution used for cleaning or etching ruthenium-containing layer and method for fabricating ruthenium wiring | Shinya Koga, Kazuhiro Takahashi | 2025-01-07 |
| 12104260 | Method for producing semiconductor element and chemical solution to be used in method for producing semiconductor element | Kazuhiro Takahashi | 2024-10-01 |
| 11898081 | Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiring | Takuya Ohhashi | 2024-02-13 |
| 11686002 | Method for manufacturing ruthenium wiring | Shinya Koga, Kazuhiro Takahashi, Natsumi OKAWA, Daijiro Mori | 2023-06-27 |
| 11518937 | Etching solution and method for manufacturing semiconductor element | Daijiro Mori | 2022-12-06 |
| 11327029 | X-ray imaging device | Satoshi Sano, Koichi Tanabe, Kenji Kimura, Satoshi Tokuda, Taro Shirai +3 more | 2022-05-10 |
| 11311260 | X-ray phase imaging apparatus | Satoshi Sano, Koichi Tanabe, Satoshi Tokuda, Akira Horiba, Naoki Morimoto | 2022-04-26 |
| 11272894 | X-ray imaging device | Satoshi Sano, Koichi Tanabe, Satoshi Tokuda, Akira Horiba, Naoki Morimoto | 2022-03-15 |
| 11268916 | X-ray phase imaging system | Satoshi Sano, Koichi Tanabe, Satoshi Tokuda, Akira Horiba, Naoki Morimoto | 2022-03-08 |
| 11179124 | X-ray phase imaging method | Satoshi Sano, Koichi Tanabe, Satoshi Tokuda, Akira Horiba, Naoki Morimoto | 2021-11-23 |
| 11166687 | X-ray imaging apparatus | Koichi Tanabe, Satoshi Tokuda, Satoshi Sano, Akira Horiba | 2021-11-09 |
| 11120994 | Etching solution, and method of producing semiconductor element | Mai Sugawara, Takuya Ohhashi | 2021-09-14 |
| 10859512 | X-ray phase contrast imaging apparatus | Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Takuro Izumi +4 more | 2020-12-08 |
| 10772592 | X-ray phase contrast imaging apparatus | Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara +7 more | 2020-09-15 |
| 10729398 | Radiation phase contrast imaging device | Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara +7 more | 2020-08-04 |
| 10643760 | Method of producing diffraction grating | Takahiro DOKI, Satoshi Tokuda, Nobukazu Hayashi, Toshinori Yoshimuta | 2020-05-05 |
| 10468365 | Semiconductor device and semiconductor detector, methods for manufacturing same, and semiconductor chip or substrate | Hiroyuki Kishihara, Toshinori Yoshimuta, Satoshi Tokuda, Makoto Motoyoshi | 2019-11-05 |
| 10254417 | Semiconductor detector | Satoshi Tokuda, Toshinori Yoshimuta, Hiroyuki Kishihara | 2019-04-09 |
| 9341566 | Resin type identification method and resin type identification apparatus | Masaru Kinugawa, Muneaki Mukuda, Sonoko Umemura, Yasuyuki Nakagawa, Naoji Moriya +1 more | 2016-05-17 |
| 8313628 | Method and apparatus for evaluating dielectrophoretic intensity of microparticle | Yoshio Tsunazawa, Naoji Moriya, Kenji Takubo, Shinichiro Totoki, Haruo Shimaoka | 2012-11-20 |
| 8274654 | Apparatus for measuring nanoparticles | — | 2012-09-25 |
| 7911610 | Optical measuring device | Naoji Moriya, Yuzo Nagumo, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe +2 more | 2011-03-22 |
| 7824504 | Electronic device cleaning equipment and electronic device cleaning method | — | 2010-11-02 |
| 7760356 | Optical measuring device and method, and nanoparticle measuring method and device | Naoji Moriya, Shinichro Totoki, Yuzo Nagumo, Naofumi Sakauchi, Fujio Inoue +2 more | 2010-07-20 |
| 7544320 | Method of manufacturing porous ceramic body | Yumi Toda, Yoshinori Yamamoto | 2009-06-09 |