Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360052 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Koki YOSHIDA | 2025-07-15 |
| 12345653 | Defect inspection apparatus | Hiroshi Horikawa | 2025-07-01 |
| 12188769 | Defect inspection device and defect inspection method | Koki YOSHIDA, Takahide HATAHORI | 2025-01-07 |
| 12111266 | Vibration measurement device | Takahide HATAHORI, Yuya Nagata | 2024-10-08 |
| 12099000 | Defect detection device and defect detection method | Takahide HATAHORI, Tomotaka Nagashima | 2024-09-24 |
| 11982641 | Method and device for examining clinched portion of tubular body | Takahide HATAHORI, Koki YOSHIDA, Yoshihaya Imamura | 2024-05-14 |
| 11977032 | Displacement measurement device and defect detection device | Takahide HATAHORI | 2024-05-07 |
| 11815493 | Defect inspection apparatus and defect inspection method | Takahide HATAHORI, Koki YOSHIDA | 2023-11-14 |
| 11790513 | Defect inspection apparatus and defect inspection method | Koki YOSHIDA, Takahide HATAHORI | 2023-10-17 |
| 11774746 | Interference image imaging apparatus | Takahide HATAHORI, Koki YOSHIDA | 2023-10-03 |
| 11391700 | Defect detection device | Takahide HATAHORI, Yuya Nagata | 2022-07-19 |
| 11226294 | Defect inspection apparatus | Takahide HATAHORI, Koki YOSHIDA | 2022-01-18 |
| 11193887 | Defect detection method and device | Takahide HATAHORI | 2021-12-07 |
| 11181510 | Inspection apparatus and inspection method | Takahide HATAHORI, Koki YOSHIDA | 2021-11-23 |
| 10942152 | Defect inspection device and method | Takahide HATAHORI, Yuya Nagata | 2021-03-09 |
| 10429172 | Defect detection method and defect detection device | Takahide HATAHORI, Yuya Nagata | 2019-10-01 |
| 10317190 | Vibration measurement device | Takahide HATAHORI, Yuya Nagata | 2019-06-11 |
| 10267618 | Defect detection method and defect detection apparatus | Takahide HATAHORI | 2019-04-23 |
| 9429471 | Photodiode array for spectrometric measurements and spectrometric measurement system | Hideki Tominaga, Ryuta Hirose, Shigetoshi Sugawa, Rihito Kuroda | 2016-08-30 |
| 9030582 | Solid state image sensor and method for driving the same | Shigetoshi Sugawa, Hideki Tominaga, Yasushi Kondo | 2015-05-12 |
| 8530947 | Solid-state image sensor | Yasushi Kondo, Hideki Tominaga, Ryuta Hirose, Shigetoshi Sugawa, Hideki Mutoh | 2013-09-10 |
| 8508739 | Gas concentration measurement device | Yousuke Hoshino, Naoji Moriya | 2013-08-13 |
| 8313628 | Method and apparatus for evaluating dielectrophoretic intensity of microparticle | Yoshio Tsunazawa, Yukihisa Wada, Naoji Moriya, Shinichiro Totoki, Haruo Shimaoka | 2012-11-20 |
| 7911610 | Optical measuring device | Naoji Moriya, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue +2 more | 2011-03-22 |
| 7432971 | In-situ storage image sensor and in-situ storage image pickup apparatus | Yasushi Kondo | 2008-10-07 |