Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360052 | Defect inspection apparatus and defect inspection method | Kenji Takubo, Koki YOSHIDA | 2025-07-15 |
| 12320781 | Joined body testing method, joined body testing device, and joined body | Ryusuke HIOKI, Yoshihaya Imamura, Chieko IMAI, Koki YOSHIDA | 2025-06-03 |
| 12188769 | Defect inspection device and defect inspection method | Koki YOSHIDA, Kenji Takubo | 2025-01-07 |
| 12111266 | Vibration measurement device | Yuya Nagata, Kenji Takubo | 2024-10-08 |
| 12099000 | Defect detection device and defect detection method | Kenji Takubo, Tomotaka Nagashima | 2024-09-24 |
| 11982641 | Method and device for examining clinched portion of tubular body | Kenji Takubo, Koki YOSHIDA, Yoshihaya Imamura | 2024-05-14 |
| 11977032 | Displacement measurement device and defect detection device | Kenji Takubo | 2024-05-07 |
| 11815493 | Defect inspection apparatus and defect inspection method | Kenji Takubo, Koki YOSHIDA | 2023-11-14 |
| 11790513 | Defect inspection apparatus and defect inspection method | Koki YOSHIDA, Kenji Takubo | 2023-10-17 |
| 11774746 | Interference image imaging apparatus | Kenji Takubo, Koki YOSHIDA | 2023-10-03 |
| 11391700 | Defect detection device | Yuya Nagata, Kenji Takubo | 2022-07-19 |
| 11226294 | Defect inspection apparatus | Kenji Takubo, Koki YOSHIDA | 2022-01-18 |
| 11193887 | Defect detection method and device | Kenji Takubo | 2021-12-07 |
| 11181510 | Inspection apparatus and inspection method | Kenji Takubo, Koki YOSHIDA | 2021-11-23 |
| 10942152 | Defect inspection device and method | Yuya Nagata, Kenji Takubo | 2021-03-09 |
| 10429172 | Defect detection method and defect detection device | Yuya Nagata, Kenji Takubo | 2019-10-01 |
| 10317190 | Vibration measurement device | Yuya Nagata, Kenji Takubo | 2019-06-11 |
| 10288550 | Flow cell | — | 2019-05-14 |
| 10267618 | Defect detection method and defect detection apparatus | Kenji Takubo | 2019-04-23 |
| 9551617 | Raman spectroscopic analyzer | Naoji Moriya | 2017-01-24 |