Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10158325 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2018-12-18 |
| 10001441 | Modification processing device, modification monitoring device and modification processing method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama, Yuji Sakai | 2018-06-19 |
| 9651607 | Photo device inspection apparatus and photo device inspection method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2017-05-16 |
| 9541508 | Inspecting device and inspecting method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2017-01-10 |
| 9450536 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2016-09-20 |
| 9404874 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2016-08-02 |
| 9383321 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2016-07-05 |
| 9234934 | Inspecting device and inspecting method | Hidetoshi Nakanishi, Akira Ito, Iwao Kawayama | 2016-01-12 |
| 9151669 | Inspecting device and inspecting method | Akira Ito, Hidetoshi Nakanishi, Iwao Kawayama | 2015-10-06 |
| 9103870 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Iwao Kawayama | 2015-08-11 |
| 8941824 | Semiconductor inspection method and semiconductor inspection apparatus | Hidetoshi Nakanishi | 2015-01-27 |
| 8872114 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Iwao Kawayama | 2014-10-28 |
| 8530868 | Electromagnetic radiation generating element, electromagnetic radiation generating device, and method of generating electromagnetic radiation | Hidetoshi Nakanishi | 2013-09-10 |
| 7466151 | Electric-field distribution measurement method and apparatus for semiconductor device | Hideyuki Ohtake, Tomoya Hirosumi, Makoto Yoshida | 2008-12-16 |
| 7173447 | Method and apparatus for diagnosing fault in semiconductor device | Masatsugu Yamashita, Kodo Kawase, Toshihiro Kiwa, Kiyoshi Nikawa | 2007-02-06 |
| 6980010 | Method and apparatus for inspecting wire breaking of integrated circuit | Kodo Kawase, Tomoya Hirosumi, Ryoichi Fukusawa | 2005-12-27 |
| 4996191 | Method for etching superconductor materials | Takeshi Kobayashi, Yoshiyuki Sakaguchi | 1991-02-26 |