Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10158325 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2018-12-18 |
| 10001441 | Modification processing device, modification monitoring device and modification processing method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi, Yuji Sakai | 2018-06-19 |
| 9651607 | Photo device inspection apparatus and photo device inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2017-05-16 |
| 9541508 | Inspecting device and inspecting method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2017-01-10 |
| 9450536 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2016-09-20 |
| 9404874 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2016-08-02 |
| 9383321 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2016-07-05 |
| 9234934 | Inspecting device and inspecting method | Hidetoshi Nakanishi, Akira Ito, Masayoshi Tonouchi | 2016-01-12 |
| 9151669 | Inspecting device and inspecting method | Akira Ito, Hidetoshi Nakanishi, Masayoshi Tonouchi | 2015-10-06 |
| 9103870 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Masayoshi Tonouchi | 2015-08-11 |
| 8872114 | Inspection apparatus and inspection method | Hidetoshi Nakanishi, Masayoshi Tonouchi | 2014-10-28 |