Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7466151 | Electric-field distribution measurement method and apparatus for semiconductor device | Hideyuki Ohtake, Makoto Yoshida, Masayoshi Tonouchi | 2008-12-16 |
| 6980010 | Method and apparatus for inspecting wire breaking of integrated circuit | Masayoshi Tonouchi, Kodo Kawase, Ryoichi Fukusawa | 2005-12-27 |