Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9897893 | Terahertz wave generation apparatus | Toshiaki Naka, Motoi Sasaki, Akito Tsuchiya | 2018-02-20 |
| 9176008 | Electromagnetic wave measuring apparatus, measuring method, program, and recording medium | Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato | 2015-11-03 |
| 8493057 | Electromagnetic wave measuring apparatus, measuring method, program, and recording medium | Shigeki Nishina, Motoki Imamura, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato | 2013-07-23 |
| 8119988 | Collection-amount detection method for particulate matters and collection-amount detection apparatus therefor and exhaust-gas converting apparatus | Shigeki Daido, Naohisa Oyama, Hitoshi Kato, Shinji Tsuji, Juji Suzuki +1 more | 2012-02-21 |
| 8121157 | Terahertz beam scanning apparatus and method thereof | Ken-ichiro Maki, Takayuki Shibuya, Chiko Otani | 2012-02-21 |
| 7381955 | Method and apparatus for inspecting target by tera-hertz wave spectrometry | Yuki Watanabe, Tomofumi Ikari | 2008-06-03 |
| 7352449 | Method and apparatus for detecting materials | Yuuki Watanabe, Tomofumi Ikari | 2008-04-01 |
| 7291838 | Apparatus and method for detecting scattered material by terahertz wave | Takayuki Shibuya, Yuichi Ogawa, Masahiro Yamashita | 2007-11-06 |
| 7173447 | Method and apparatus for diagnosing fault in semiconductor device | Masatsugu Yamashita, Masayoshi Tonouchi, Toshihiro Kiwa, Kiyoshi Nikawa | 2007-02-06 |
| 6980010 | Method and apparatus for inspecting wire breaking of integrated circuit | Masayoshi Tonouchi, Tomoya Hirosumi, Ryoichi Fukusawa | 2005-12-27 |
| 6903341 | Apparatus for generating tera-Hertz wave and tuning method | Kazuhiro Imai, Hiromasa Ito | 2005-06-07 |