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Electromagnetic wave measuring apparatus, measuring method, program, and recording medium |
Shigeki Nishina, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato, Kodo Kawase |
2015-11-03 |
| 8969807 |
Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the same |
Shigeki Nishina |
2015-03-03 |
| 8493057 |
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium |
Shigeki Nishina, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato, Kodo Kawase |
2013-07-23 |
| 8481938 |
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium |
Shigeki Nishina, Akiyoshi Irisawa, Tomoyu Yamashita, Eiji Kato |
2013-07-09 |
| 8279438 |
Optical measuring apparatus |
Tomoyu Yamashita |
2012-10-02 |
| 8210035 |
Collection medium and collection amount measuring apparatus, and measuring method, program, and recording medium of the same |
Shigeki Nishina |
2012-07-03 |
| 8183528 |
Electromagnetic wave measuring apparatus, measurement method, a program, and a recording medium |
Eiji Kato, Shigeki Nishina, Akiyoshi Irisawa, Tomoyu Yamashita |
2012-05-22 |
| 8053733 |
Electromagnetic wave measuring apparatus |
Shigeki Nishina |
2011-11-08 |
| 7006207 |
Polarization mode dispersion measuring device, method, recording medium |
Takeshi Ozeki, Tomoyu Yamashita |
2006-02-28 |
| 6678041 |
Optical characteristic measuring apparatus, the method thereof and recording medium |
Eiji Kimura, Fumio Inui |
2004-01-13 |
| 6654104 |
Apparatus and method for measuring optical characteristics and recording medium |
Eiji Kimura, Toshio Kawazawa |
2003-11-25 |
| 6519028 |
Optical characteristic measuring apparatus, the method thereof and recording medium |
Eiji Kimura |
2003-02-11 |
| 6493074 |
Method and apparatus for measuring an optical transfer characteristic |
Shiro Ryu |
2002-12-10 |
| 6444163 |
Heat shielding apparatus for vertical continuous annealing furnace |
Naoto Ueno, Sachihiro Iida, Takaaki Kobashi |
2002-09-03 |
| 6433865 |
Apparatus and method for measuring optical characteristics and recording medium |
Eiji Kimura, Toshio Kawazawa, Satoru Nagumo |
2002-08-13 |