Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11289621 | Method for producing semiconductor light emitting element | Minoru Yamamoto, Naoto Inoue, Hiroaki TAMEMOTO, Yoshitaka Hotta | 2022-03-29 |
| 9841272 | Film thickness measuring device and film thickness measuring method | Jun Takayanagi, Hideyuki Aikyo, Yasunari Fujisawa, Atsuo Nabeshima | 2017-12-12 |
| 8513608 | Coating film inspection apparatus and inspection method | Yuzuru Uehara, Jun Takayanagi | 2013-08-20 |
| 8497490 | Terahertz wave generation device and method for generating terahertz wave | Yuzuru Uehara, Koichiro Tanaka, Masaya Nagai | 2013-07-30 |
| 8450689 | Device and method for measuring thickness of paint film in non-contacting manner | Yuki Ichikawa | 2013-05-28 |
| 7593099 | Method and device for configuration examination | Toshiharu Sugiura | 2009-09-22 |
| 7488940 | Reflection type terahertz spectrometer and spectrometric method | Makoto Yoshida, Koichiro Tanaka, Masaya Nagai | 2009-02-10 |
| 7466151 | Electric-field distribution measurement method and apparatus for semiconductor device | Tomoya Hirosumi, Makoto Yoshida, Masayoshi Tonouchi | 2008-12-16 |
| 7221451 | Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulse | Koichiro Tanaka, Masaya Nagai, Junpei Yamashita, Kumiko Yamashita | 2007-05-22 |
| 7177071 | Semiconductor crystal for generating terahertz waves, terahertz wave-generator incorporating the crystal, semiconductor crystal for detecting terahertz waves, and terahertz waves detector incorporating the crystal | Toshiharu Sugiura, Toshiaki Bessho, Koichiro Tanaka, Masaya Nagai, Yutaka Kadoya | 2007-02-13 |
| 7096384 | Fault simulator for verifying reliability of test pattern | Chika Nishioka, Yoshikazu Akamatsu | 2006-08-22 |