Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8288825 | Formation of raised source/drain structures in NFET with embedded SiGe in PFET | Yung Fu Chong, Zhijiong Luo, Judson R. Holt | 2012-10-16 |
| 7939413 | Embedded stressor structure and process | Yung Fu Chong, Zhijiong Luo, Brian J. Greene, Kern Rim | 2011-05-10 |
| 7838390 | Methods of forming integrated circuit devices having ion-cured electrically insulating layers therein | Jun Jung Kim, Jae-eon Park, Richard A. Conti, Zhao Lun, Johnny Widodo +2 more | 2010-11-23 |
| 7718500 | Formation of raised source/drain structures in NFET with embedded SiGe in PFET | Yung Fu Chong, Zhijiong Luo, Judson R. Holt | 2010-05-18 |
| 7564092 | Flash memory device having a split gate | Eui-Youl Ryu, Chul-Soon Kwon, Jin Woo Kim, Yong Hee Kim, Dai-Geun Kim | 2009-07-21 |
| 7195933 | Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern | Sang Wook Park, Jae-Min Yu, Chul-Soon Kwon, Jin Woo Kim, Jae Hyun Park +5 more | 2007-03-27 |
| 7094646 | Flash memory device having a split gate and method of manufacturing the same | Eui-Youl Ryu, Chul-Soon Kwon, Jin Woo Kim, Yong Hee Kim, Dai-Geun Kim | 2006-08-22 |
| 6977200 | Method of manufacturing split-gate memory | Yong Hee Kim, Chul-Soon Kwon, Jin Woo Kim, Dae Geun Kim, Eui-Youl Ryu | 2005-12-20 |
| 6924505 | Semiconductor device having a measuring pattern and a method of measuring the semiconductor device using the measuring pattern | Sang Wook Park, Jae-Min Yu, Chul-Soon Kwon, Jin Woo Kim, Jae Hyun Park +5 more | 2005-08-02 |
| 6800525 | Method of manufacturing split gate flash memory device | Eui-Youl Ryu, Jae-Min Yu, Jin Woo Kim, Jae Hyun Park, Yong Hee Kim +6 more | 2004-10-05 |