JL

Jae Il Lee

Samsung: 30 patents #4,061 of 75,807Top 6%
SH Sk Hynix: 6 patents #1,223 of 4,849Top 30%
KC Kepco Nuclear Fuel Co.: 2 patents #63 of 197Top 35%
CC Cmg Pharmaceutical Co.: 1 patents #10 of 42Top 25%
KA Kakao: 1 patents #141 of 354Top 40%
HA Handok: 1 patents #7 of 39Top 20%
HM Hyundai Motor: 1 patents #6,384 of 11,886Top 55%
📍 Suneung-ri, KR: #116 of 2,357 inventorsTop 5%
Overall (All Time): #66,901 of 4,157,543Top 2%
44
Patents All Time

Issued Patents All Time

Showing 26–44 of 44 patents

Patent #TitleCo-InventorsDate
9285371 Method of screening antibodies with high antigen selectivity Min Kyung Kim 2016-03-15
8987425 Pharmaceutical composition for preventing or treating cancer 2015-03-24
8957781 Real time monitoring system of spent fuel pool and method thereof Sang Jong Lee, Jae Don Choi, Young Baek Kim, Tae Je Kwon, Hae Chan Lee +4 more 2015-02-17
8911954 Polypeptide linker and method of analyzing target material using the same Kyung-yeon Han, Yeon-jeong Kim, Jeong-gun Lee 2014-12-16
8889376 Fusion protein binding specifically to constant region of antibody, method of preparing the fusion protein, and method of isolating antibody using the fusion protein Young-sun Lee, Tae-Soo Lee 2014-11-18
8859507 Protein complex for intracellular delivery and uses thereof 2014-10-14
8767468 Nonvolatile memory device capable of reducing read disturbance and read method thereof Moon Sone 2014-07-01
8482308 Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same Ki-Jae Song, Hun-Kyo Seo, Jong-won Han, Jong Pil Park 2013-07-09
8476908 Signal capture system and test apparatus including the same Woon-sup Choi, Ho Sun Yoo, In-su Yang, Min Sung Kim, Jong-pill Park +5 more 2013-07-02
8103927 Field mounting-type test apparatus and method for testing memory component or module in actual PC environment In Ho Choi, Woon-sup Choi, Sung Yeol Kim, Young-Ki Kwak, Chul-woong Jang +3 more 2012-01-24
7838790 Multifunctional handler system for electrical testing of semiconductor devices Seong-goo Kang, Jun Ho Lee, Ki-Sang Kang, Hyun-Seop Shim, Do-young Kam +1 more 2010-11-23
7772828 Automatic test equipment capable of high speed test Chul-woong Jang, Seung-Ho Jang, Young Jin Lee 2010-08-10
7554349 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments Seong-goo Kang, Jun Ho Lee, Ki-Sang Kang, Hyun-Seop Shim, Do-young Kam +1 more 2009-06-30
7438563 Connector for testing a semiconductor package Young Bae Chung, Hyun-Seop Shim, Jeong-Ho Bang, Hyun-Kyo Seo, Young-Soo An +1 more 2008-10-21
7084655 Burn-in test apparatus for BGA packages using forced heat exhaust Byung-Jun Min, Woo Jin Kim, Jeong-Ho Bang, Hyun-Seop Shim, Hyun-Geun Iy 2006-08-01
6841425 Wafer treatment method for protecting fuse box of semiconductor chip Jeong-Ho Bang, Young Moon LEE, Hyo-geun Chae 2005-01-11
6489790 Socket including pressure conductive rubber and mesh for testing of ball grid array package Young-Soo An, Hyo-geun Chae, Jeong-Ho Bang 2002-12-03
6396294 Socket pin and socket for electrical testing of semiconductor packages Young-Soo An, Young Moon LEE, Hyo-geun Chae 2002-05-28
5788312 System and method for opening and shutting a trunk lid of a vehicle 1998-08-04