Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12287367 | Test board and test device including the same | Hyung-il Kim, Joo-sung Yun, Sang-Do Han | 2025-04-29 |
| 10855185 | Semiconductor circuit including a DC-DC converter and a voltage regulator | Jong-Woon Yoo | 2020-12-01 |
| 10816594 | Apparatus for testing a signal speed of a semiconductor package and method of manufacturing a semiconductor package | — | 2020-10-27 |
| 10732219 | Apparatus and method for testing semiconductor device and system comprising the same | — | 2020-08-04 |
| 10551434 | Rechargeable power module and test system including the same | Jong-Woon Yoo, Soo Yong Park | 2020-02-04 |
| 10203369 | Test board, test equipment, test system, and test method | Joo-sung Yun, Ung Jang, Woon-sup Choi, Jae-Hyun Kim | 2019-02-12 |
| 9759769 | Rechargeable power module and test system including the same | Jong-Woon Yoo, Soo Yong Park | 2017-09-12 |
| 9612276 | Test device and test system including the same | Jong-Woon Yoo, Sang Kyeong Han, Ung Jang | 2017-04-04 |
| 9513333 | Test interface board and test system including the same | Jong-Woon Yoo | 2016-12-06 |
| 8872531 | Semiconductor device and test apparatus including the same | Ung Jang, Jun Young Park, Sung Gu Lee, Hong-seok Yeon | 2014-10-28 |
| 8832638 | Package test devices having a printed circuit board | Jae-hoon Jeong, Chang-Woo Ko, Hun-Kyo Seo | 2014-09-09 |
| 8750061 | Memory system, memory test system and method of testing memory system and memory test system | Soo-haeng Cho, Sung-dong Suh, Kyoung-ho Ha, Seong-gu Kim, Yeoung-kum Kim +1 more | 2014-06-10 |
| 8482308 | Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same | Hun-Kyo Seo, Jae Il Lee, Jong-won Han, Jong Pil Park | 2013-07-09 |
| 8407659 | Method of designing a printed circuit board | Jae-hoon Jeong, Chang-Woo Ko, Hun-Kyo Seo | 2013-03-26 |
| 8106675 | Test system | Hun-Kyo Seo | 2012-01-31 |
| 8023349 | Memory system, memory test system and method of testing memory system and memory test system | Soo-haeng Cho, Sung-dong Suh, Kyoung-ho Ha, Seong-gu Kim, Yeoung-kum Kim +1 more | 2011-09-20 |
| 7755449 | Printed circuit board having impedance-matched strip transmission line | — | 2010-07-13 |
| 7671617 | Test system to test multi-chip package compensating a signal distortion | — | 2010-03-02 |