Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9064732 | Semiconductor device including work function control film patterns and method for fabricating the same | Cheong-Sik Yu, Ju-Youn Kim, Chang Min Hong | 2015-06-23 |
| 8941183 | Semiconductor device | Cheong-Sik Yu, Ju-Youn Kim, Chang Min Hong | 2015-01-27 |
| 7840917 | Method of correcting a design pattern for an integrated circuit and an apparatus for performing the same | Jin-Hee Kim, You-Seung Jin, Dong Hun Lee | 2010-11-23 |
| 7802210 | Methods and systems for analyzing layouts of semiconductor integrated circuit devices | Gwang-hyeon Baek, Min-Geon Cho | 2010-09-21 |
| 7733099 | Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect | Yong-Woon Han, Mi-Joung Lee, Sang-deok Kwon | 2010-06-08 |
| 7705621 | Test pattern and method of monitoring defects using the same | Hyock-Jun Lee, Yeong-Lyeol Park, Nam-young Lee, Mi-Joung Lee | 2010-04-27 |
| 7703055 | Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole | Sang-deok Kwon, Min-Geon Cho, Gwang-hyeon Baek | 2010-04-20 |
| 7642106 | Methods for identifying an allowable process margin for integrated circuits | You-Seung Jin | 2010-01-05 |