Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916476 | Semiconductor devices with various line widths and method of manufacturing the same | Je-Min Yoo, Yuri Masuoka | 2021-02-09 |
| 10770355 | Semiconductor devices with various line widths and method of manufacturing the same | Je-Min Yoo, Yuri Masuoka | 2020-09-08 |
| 7733099 | Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect | Choel-Hwyi Bae, Yong-Woon Han, Mi-Joung Lee | 2010-06-08 |
| 7703055 | Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole | Choel-Hwyi Bae, Min-Geon Cho, Gwang-hyeon Baek | 2010-04-20 |
| 7468530 | Structure and method for failure analysis in a semiconductor device | Ki-Am Lee, Jong Hyun Lee | 2008-12-23 |