Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7802210 | Methods and systems for analyzing layouts of semiconductor integrated circuit devices | Choel-Hwyi Bae, Gwang-hyeon Baek | 2010-09-21 |
| 7703055 | Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole | Choel-Hwyi Bae, Sang-deok Kwon, Gwang-hyeon Baek | 2010-04-20 |