Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7733099 | Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect | Choel-Hwyi Bae, Yong-Woon Han, Sang-deok Kwon | 2010-06-08 |
| 7705621 | Test pattern and method of monitoring defects using the same | Hyock-Jun Lee, Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-young Lee | 2010-04-27 |