Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7705621 | Test pattern and method of monitoring defects using the same | Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-young Lee, Mi-Joung Lee | 2010-04-27 |
HL
Hyock-Jun Lee
Overall (All Time): #3,286,664 of 4,157,543Top 80%
1
Patents All Time