Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7747914 | Memory diagnosis test circuit and test method using the same | Yong-Woon Han | 2010-06-29 |
| 7598615 | Analytic structure for failure analysis of semiconductor device having a multi-stacked interconnection structure | Jong Hyun Lee | 2009-10-06 |
| 7468530 | Structure and method for failure analysis in a semiconductor device | Sang-deok Kwon, Jong Hyun Lee | 2008-12-23 |