Ajay Pai — 15 Patents at Rudolph Technologies

Ajay Pai has been granted 15 US patents while listed as an inventor at Rudolph Technologies. The first was granted in 2005 and the most recent in November 2025. Ajay Pai ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Ajay Pai in Maple Grove, MN, US.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12469770	Power semiconductor module with rivet or press fit pin and method for fabricating the same	Tan Kwang Hong, Adrian Lis, Oliver Markus Kreiter, Matthias Rose	2025-11-11
12113000	Lead adapters for semiconductor package	Tino Karczewski, Adrian Lis	2024-10-08
11846438	Migration of settings from a non-connected building controller to another building controller	Nathaniel Kraft, Bernard T. Geary, Michael Albright, Sharath Venkatesha, Jeffrey Boll	2023-12-19
11650555	Bluetooth thermostat and hub	David J. Emmons, Soumitri Kolavennu	2023-05-16
11156375	Migration of settings from a non-connected building controller to another building controller	Nathaniel Kraft, Bernard T. Geary, Michael Albright, Sharath Venkatesha, Jeffrey Boll	2021-10-26
10691083	Thermostat system for remote reading, setting, and control of devices	David J. Emmons, Soumitri Kolavennu	2020-06-23
10372093	Comfort mapping using wearables	Pedro Davalos, Wendy Foslien	2019-08-06
9062859	Wafer edge inspection illumination system	Christopher Voges, Antony Ravi Philip, Tuan D. Le	2015-06-23	$3,075,000
8818074	Wafer edge inspection and metrology	Tuan D. Le	2014-08-26	$2,024,000
8492178	Method of monitoring fabrication processing including edge bead removal processing	Alan Carlson, Tuan D. Le, Antony Ravi Philip	2013-07-23	$3,478,000
8426223	Wafer edge inspection	Christopher Voges, Antony Ravi Philip, Tuan D. Le	2013-04-23	$1,578,000
8175372	Wafer edge inspection and metrology	Tuan D. Le	2012-05-08	$2,658,000
7865010	Wafer edge inspection and metrology	Tuan D. Le	2011-01-04	$2,993,000
7616804	Wafer edge inspection and metrology	Tuan D. Le	2009-11-10	$2,160,000
6870897	Method for identification of cotton contaminants with x-ray microtomographic image analysis	Hamed Sari-Sarraf, Eric Hequet	2005-03-22

Ajay Pai — 15 Patents

Issued Patents All Time

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