Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12113000 | Lead adapters for semiconductor package | Tino Karczewski, Adrian Lis | 2024-10-08 |
| 11846438 | Migration of settings from a non-connected building controller to another building controller | Nathaniel Kraft, Bernard T. Geary, Michael Albright, Sharath Venkatesha, Jeffrey Boll | 2023-12-19 |
| 11650555 | Bluetooth thermostat and hub | David J. Emmons, Soumitri Kolavennu | 2023-05-16 |
| 11156375 | Migration of settings from a non-connected building controller to another building controller | Nathaniel Kraft, Bernard T. Geary, Michael Albright, Sharath Venkatesha, Jeffrey Boll | 2021-10-26 |
| 10691083 | Thermostat system for remote reading, setting, and control of devices | David J. Emmons, Soumitri Kolavennu | 2020-06-23 |
| 10372093 | Comfort mapping using wearables | Pedro Davalos, Wendy Foslien | 2019-08-06 |
| 9062859 | Wafer edge inspection illumination system | Christopher Voges, Antony Ravi Philip, Tuan D. Le | 2015-06-23 |
| 8818074 | Wafer edge inspection and metrology | Tuan D. Le | 2014-08-26 |
| 8492178 | Method of monitoring fabrication processing including edge bead removal processing | Alan Carlson, Tuan D. Le, Antony Ravi Philip | 2013-07-23 |
| 8426223 | Wafer edge inspection | Christopher Voges, Antony Ravi Philip, Tuan D. Le | 2013-04-23 |
| 8175372 | Wafer edge inspection and metrology | Tuan D. Le | 2012-05-08 |
| 7865010 | Wafer edge inspection and metrology | Tuan D. Le | 2011-01-04 |
| 7616804 | Wafer edge inspection and metrology | Tuan D. Le | 2009-11-10 |
| 6870897 | Method for identification of cotton contaminants with x-ray microtomographic image analysis | Hamed Sari-Sarraf, Eric Hequet | 2005-03-22 |