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Lead adapters for semiconductor package |
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Migration of settings from a non-connected building controller to another building controller |
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Bluetooth thermostat and hub |
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| 11156375 |
Migration of settings from a non-connected building controller to another building controller |
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Thermostat system for remote reading, setting, and control of devices |
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| 10372093 |
Comfort mapping using wearables |
Pedro Davalos, Wendy Foslien |
2019-08-06 |
| 9062859 |
Wafer edge inspection illumination system |
Christopher Voges, Antony Ravi Philip, Tuan D. Le |
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| 8818074 |
Wafer edge inspection and metrology |
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2014-08-26 |
| 8492178 |
Method of monitoring fabrication processing including edge bead removal processing |
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2013-07-23 |
| 8426223 |
Wafer edge inspection |
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2013-04-23 |
| 8175372 |
Wafer edge inspection and metrology |
Tuan D. Le |
2012-05-08 |
| 7865010 |
Wafer edge inspection and metrology |
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2011-01-04 |
| 7616804 |
Wafer edge inspection and metrology |
Tuan D. Le |
2009-11-10 |
| 6870897 |
Method for identification of cotton contaminants with x-ray microtomographic image analysis |
Hamed Sari-Sarraf, Eric Hequet |
2005-03-22 |
