Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7601978 | Fabric wrinkle evaluation | Eric Hequet, Christopher Turner, Aijun Zhu | 2009-10-13 |
| 7218772 | Method for non-referential defect characterization using fractal encoding and active contours | Shaun S. Gleason | 2007-05-15 |
| 6870897 | Method for identification of cotton contaminants with x-ray microtomographic image analysis | Eric Hequet, Ajay Pai | 2005-03-22 |
| 6553133 | Four-dimensional characterization of a sheet-forming web | James S. Goddard | 2003-04-22 |
| 6456899 | Context-based automated defect classification system using multiple morphological masks | Shaun S. Gleason, Martin Hunt | 2002-09-24 |
| 6421409 | Ultra-high resolution computed tomography imaging | Michael J. Paulus, Kenneth W. Tobin, Jr., Shaun S. Gleason, Clarence E. Thomas | 2002-07-16 |
| 6399951 | Simultaneous CT and SPECT tomography using CZT detectors | Michael J. Paulus, Michael L. Simpson, Charles L. Britton, Jr. | 2002-06-04 |
| 5982920 | Automated defect spatial signature analysis for semiconductor manufacturing process | Kenneth W. Tobin, Jr., Shaun S. Gleason, Thomas P. Karnowski | 1999-11-09 |