TK

Thomas P. Karnowski

UT Ut-Battelle: 10 patents #96 of 1,792Top 6%
UT University Of Tennessee: 1 patents #417 of 1,053Top 40%
LM Lockheed Martin: 1 patents #2,805 of 6,507Top 45%
📍 Knoxville, TN: #250 of 2,927 inventorsTop 9%
🗺 Tennessee: #1,681 of 20,272 inventorsTop 9%
Overall (All Time): #451,532 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11429865 Optimizing neural networks Robert M. Patton, Steven R. Young, Derek C. Rose, Seung-Hwan Lim, Thomas E. Potok +1 more 2022-08-30
8503749 Method and system for the diagnosis of disease using retinal image content and an archive of diagnosed human patient data Kenneth W. Tobin, Jr., Edward Chaum 2013-08-06
8487993 Estimating vehicle height using homographic projections Mark F. Cunningham, Lorenzo Fabris, Timothy F. Gee, Frezghi H. Ghebretati, Jr., James S. Goddard +1 more 2013-07-16
8243999 Method and system for the diagnosis of disease using retinal image content and an archive of diagnosed human patient data Kenneth W. Tobin, Jr., Edward Chaum 2012-08-14
8218838 Method and system for assigning a confidence metric for automated determination of optic disc location Kenneth W. Tobin, Jr., Vijaya Priya Muthusamy Govindasamy, Edward Chaum 2012-07-10
7973276 Calibration method for video and radiation imagers Mark F. Cunningham, Lorenzo Fabris, Timothy F. Gee, James S. Goddard, Klaus-Peter Ziock 2011-07-05
7672976 Method for the reduction of image content redundancy in large image databases Kenneth W. Tobin, Jr. 2010-03-02
7312875 Two-wavelength spatial-heterodyne holography Gregory R. Hanson, Philip R. Bingham, John T. Simpson, Edgar Voelkl 2007-12-25
6751343 Method for indexing and retrieving manufacturing-specific digital imagery based on image content Regina Kay Ferrell, Kenneth W. Tobin, Jr. 2004-06-15
6535776 Method for localizing and isolating an errant process step Kenneth W. Tobin, Jr., Regina Kay Ferrell 2003-03-18
5982920 Automated defect spatial signature analysis for semiconductor manufacturing process Kenneth W. Tobin, Jr., Shaun S. Gleason, Hamed Sari-Sarraf 1999-11-09