Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585253 | CTIR spectrometer for large area assessment of gas emissions | Philip R. Bingham, Panagiotis G. Datskos, Tommy J. Phelps | 2020-03-10 |
| 8503749 | Method and system for the diagnosis of disease using retinal image content and an archive of diagnosed human patient data | Thomas P. Karnowski, Edward Chaum | 2013-08-06 |
| 8304737 | Apparatus and method to achieve high-resolution microscopy with non-diffracting or refracting radiation | Philip R. Bingham, Ayman I. Hawari | 2012-11-06 |
| 8243999 | Method and system for the diagnosis of disease using retinal image content and an archive of diagnosed human patient data | Thomas P. Karnowski, Edward Chaum | 2012-08-14 |
| 8218838 | Method and system for assigning a confidence metric for automated determination of optic disc location | Thomas P. Karnowski, Vijaya Priya Muthusamy Govindasamy, Edward Chaum | 2012-07-10 |
| 7672976 | Method for the reduction of image content redundancy in large image databases | Thomas P. Karnowski | 2010-03-02 |
| 6751343 | Method for indexing and retrieving manufacturing-specific digital imagery based on image content | Regina Kay Ferrell, Thomas P. Karnowski | 2004-06-15 |
| 6535776 | Method for localizing and isolating an errant process step | Thomas P. Karnowski, Regina Kay Ferrell | 2003-03-18 |
| 6421409 | Ultra-high resolution computed tomography imaging | Michael J. Paulus, Hamed Sari-Sarraf, Shaun S. Gleason, Clarence E. Thomas | 2002-07-16 |
| 6195412 | Confocal coded aperture imaging | Clarence E. Thomas | 2001-02-27 |
| 5982920 | Automated defect spatial signature analysis for semiconductor manufacturing process | Shaun S. Gleason, Thomas P. Karnowski, Hamed Sari-Sarraf | 1999-11-09 |
| 5381492 | Fiber optic vibration sensor | Joseph B. Dooley, Jeffrey D. Muhs | 1995-01-10 |
| 5260520 | Apparatus for weighing and identifying characteristics of a moving vehicle | Jeffrey D. Muhs, John K. Jordan, John V. LaForge | 1993-11-09 |