Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer edge inspection and metrology

Wafer edge inspection and metrology

US Patent 7865010 · Granted Jan 4, 2011

Estimated economic value: $2,993,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Power semiconductor module with rivet or press fit pin and method for fabricatin2025
Paper sheet transport device and paper sheet handling device2025
Lead adapters for semiconductor package2024
Migration of settings from a non-connected building controller to another buildi2023
Bluetooth thermostat and hub2023
Migration of settings from a non-connected building controller to another buildi2021
Thermostat system for remote reading, setting, and control of devices2020
Comfort mapping using wearables2019
Wafer edge inspection illumination system2015
Wafer edge inspection illumination system2015
Wafer edge inspection and metrology2014
Wafer edge inspection and metrology2014