PJ

Palkesh Jain

QU Qualcomm: 12 patents #1,765 of 12,104Top 15%
TI Texas Instruments: 9 patents #1,613 of 12,488Top 15%
UM University of Minnesota: 1 patents #1,216 of 2,951Top 45%
Overall (All Time): #194,200 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11424621 Configurable redundant systems for safety critical applications Rahul Gulati 2022-08-23
11416049 In-field monitoring of on-chip thermal, power distribution network, and power grid reliability Rahul Gulati 2022-08-16
10901020 Digital duty-cycle monitoring of a periodic signal Rahul Gulati, Edward Jacob MEISAROSH 2021-01-26
10591965 System and method for context-aware thermal management and workload scheduling in a portable computing device Ronald Alton, Jon James Anderson, Mehdi Saeidi 2020-03-17
10389379 Error correcting code testing Rahul Gulati, Pranjal Bhuyan, Mohammad Reza Kakoee 2019-08-20
10141297 Integrated device comprising device level cells with variable sizes for heat dissipation around hotspots Mehdi Saeidi, Jon James Anderson, Chethan Swamynathan, Richard E. Wunderlich 2018-11-27
10103714 Adjust voltage for thermal mitigation Manoj Mehrotra, Yuancheng Chris Pan, Shih-Hsin Jason Hu 2018-10-16
10089194 System and method for false pass detection in lockstep dual core or triple modular redundancy (TMR) systems Virendra Bansal, Rahul Gulati 2018-10-02
10042405 Adjusting source voltage based on stored information Manoj Mehrotra 2018-08-07
9915968 Systems and methods for adaptive clock design Virendra Bansal, Manoj Mehrotra, Keith Alan Bowman 2018-03-13
9897651 Ultra-fast autonomous clock monitoring circuit for safe and secure automotive applications Virendra Bansal, Rahul Gulati, Roberto Avanzi 2018-02-20
9665680 Cell-level signal electromigration Sachin S. Sapatnekar, Vivek Mishra, Gracieli Posser, Ricardo Reis 2017-05-30
9628089 Supply voltage tracking clock generator in adaptive clock distribution systems Keith Alan Bowman, Virendra Bansal 2017-04-18
8786307 Bias temperature instability-resistant circuits 2014-07-22
8677303 Electromigration compensation system Young-Joon Park 2014-03-18
8296701 Method for designing a semiconductor device based on leakage current estimation Ajoy Mandal, Arvind Nembili Veeravalli, Venkatasubramanyam Visvanathan 2012-10-23
8255850 Fabricating IC with NBTI path delay within timing constraints Arvind Nembili Veeravalli, Ajoy Mandal 2012-08-28
8219953 Budgeting electromigration-related reliability among metal paths in the design of a circuit Young-Joon Park, Srikanth Krishnan, Guru Prasad 2012-07-10
8013635 Multi-mode circuit and a method for preventing degradation in the multi-mode circuit Nagaraj Savithri, Usha Narasimha 2011-09-06
7791926 SEU hardening circuit and method 2010-09-07
7752582 Method and apparatus for determining electro-migration in integrated circuit designs Ajoy Mandal 2010-07-06
7689377 Technique for aging induced performance drift compensation in an integrated circuit Hugh Mair 2010-03-30