Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged-particle microscope providing depth-resolved imagery

Charged-particle microscope providing depth-resolved imagery

US Patent 9711325 · Granted Jul 18, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Sparse image reconstruction from neighboring tomography tilt images2025
Live-assisted image acquisition method and system with charged particle microsco2025
Data acquisition in charged particle microscopy2025
Method implemented by a data processing apparatus, and charged particle beam dev2024
Dual speed acquisition for drift corrected, fast, low dose, adaptive composition2024
Adaptive specimen image acquisition using an artificial neural network2024
Training an artificial neural network using simulated specimen images2024
Adaptive specimen image acquisition2024
Charged particle microscope scan masking for three-dimensional reconstruction2023
Dual speed acquisition for drift corrected, fast, low dose, adaptive composition2022
Method, device and system for remote deep learning for microscopic image reconst2022
Method, device and system for remote deep learning for microscopic image reconst2022