Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer defect discovery

Wafer defect discovery

US Patent 9518934 · Granted Dec 13, 2016

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Deep learning image denoising for semiconductor-based applications2025
Unloading robots2025
Process window qualification modulation layouts2025
Print check repeater defect detection2025
Method for constructing a convolution neural network based on farmland images, e2024
Setting up inspection of a specimen2023
Computer assisted weak pattern detection and quantification system2023
System and method for determining defects using physics-based image perturbation2023
Nuisance mining for novel defect discovery2022
Low cost roped jump lift concept2022
Methods and systems for inspection of semiconductor structures with automaticall2022
Method for process monitoring with optical inspections2022