Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for inspection of semiconductor structures with automatically generated defect features

Methods and systems for inspection of semiconductor structures with automatically generated defect features

US Patent 11379967 · Granted Jul 5, 2022

Estimated economic value: $87,510,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electrified vehicle battery packs with polymer-based enclosures2025
Deep learning image denoising for semiconductor-based applications2025
Deep learning image denoising for semiconductor-based applications2025
Deep learning image denoising for semiconductor-based applications2025
Deep learning image denoising for semiconductor-based applications2025
Process window qualification modulation layouts2025
Electrified vehicle battery packs with polymer-based enclosures2024
Traction battery securing assembly and method2024
Battery pack with thermal barrier2024
Battery pack enclosure with turned flange2023
Split panel array plate assemblies for electrified vehicle battery packs2023
Method and structures to isolate dissimilar metal structures2023