Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Computer-implemented methods for performing one or more defect-related functions

Computer-implemented methods for performing one or more defect-related functions

US Patent 9037280 · Granted May 19, 2015

Estimated economic value: $42,961,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Prosthetic heart valve packaging and attachment assembly2023
Methods and systems for inspection of wafers and reticles using designer intent 2022
Systems and methods for handling latent anomalies2020
Methods and systems for inspection of wafers and reticles using designer intent 2020
Systems and methods for handling latent anomalies2019
Selecting one or more parameters for inspection of a wafer2017
Decision tree construction for automatic classification of defects on semiconduc2016
Selecting parameters for defect detection methods2016
Methods and systems for inspection of wafers and reticles using designer intent 2015
Unbiased wafer defect samples2015
Determining a condition of a system based on plural measurements2014
Methods and systems for managing informed consent processes2014