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Methods and systems for inspection of wafers and reticles using designer intent data

US Patent 9002497 · Granted Apr 7, 2015

Estimated economic value: $23,038,000 ⓘ

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Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022