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Methods and systems for inspection of wafers and reticles using designer intent data

US Patent 10713771 · Granted Jul 14, 2020

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Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022
Methods and systems for inspection of wafers and reticles using designer intent 2022