Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Dense register array for enabling scan out observation of both L1 and L2 latches

Dense register array for enabling scan out observation of both L1 and L2 latches

US Patent 8423844 · Granted Apr 16, 2013

Estimated economic value: $3,567,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Circuit for detecting structural defects in an integrated circuit chip, methods 2017
Verifying partial good voltage island structures2015
Circuit for detecting structural defects in an integrated circuit chip, methods 2015
Method and device for selectively adding timing margin in an integrated circuit2013
Test path selection and test program generation for performance testing integrat2013
Method and device for selectively adding timing margin in an integrated circuit2013
Disposition of integrated circuits using performance sort ring oscillator and pe2013
Method and device for selectively adding timing margin in an integrated circuit2013
Microcontroller for logic built-in self test (LBIST)2013
Microcontroller for logic built-in self test (LBIST)2013
Method and apparatus for increased effectiveness of delay and transition fault t2013
Method and apparatus for a robust embedded interface2012