Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Interferometer and method for measuring characteristics of optically unresolved surface features

Interferometer and method for measuring characteristics of optically unresolved surface features

US Patent 7684049 · Granted Mar 23, 2010

Estimated economic value: $2,546,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Interometric optical system2024
Heterodyning optical phase measuring device for specular surfaces2021
Heterodyning optical phase measuring device for specular surfaces2020
Metrology of multi-layer stacks2020
Surface topography apparatus and method2019
Calibration of scanning interferometers2018
Measuring topography of aspheric and other non-flat surfaces2017
Double pass interferometric encoder system2017
Method and system for determining information about a transparent optical elemen2017
Method and apparatus for separation of workpieces and articles produced thereby2017
Optical evaluation of lenses and lens molds2017
Interferometry employing refractive index dispersion broadening of interference 2016