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Home › Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration

Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration

US Patent 7302625 · Granted Nov 27, 2007

Estimated economic value: $2,940,000 ⓘ

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