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Home › Multi-functional structure for enhanced chip manufacturibility and reliability for low k dielectrics semiconductors and a crackstop integrity screen and monitor

Multi-functional structure for enhanced chip manufacturibility and reliability for low k dielectrics semiconductors and a crackstop integrity screen and monitor

US Patent 7098676 · Granted Aug 29, 2006

Estimated economic value: $3,832,000 ⓘ

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