Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators

Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators

US Patent 6381564 · Granted Apr 30, 2002

Estimated economic value: $26,893,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Embedded system to characterize BTI degradation effects in MOSFETs2025
Test structures for measuring silicon thickness in fully depleted silicon-on-ins2020
Method for applying charge-based-capacitance-measurement with switches using onl2020
Test structures and method for electrical measurement of FinFET fin height2020
System and method for automated integration and stress testing of hardware and s2019
Method for accurate measurement of leaky capacitors using charge based capacitan2018
Test structures and methods for measuring silicon thickness in fully depleted si2017
High voltage ultrasound transmitter with gate protection diodes and intrinsic ou2015
Methods for yield variability benchmarking, assessment, quantification, and loca2013
Systems and methods for detecting and monitoring nickel-silicide process and ind2011
System and method for product yield prediction2010
System and method for product yield prediction2010