Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor device

Test board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor device

US Patent 5831441 · Granted Nov 3, 1998

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Drive system and drive control method2021
Drive system and drive control method2020
Power supply system with improved energy recovery from regenerative braking2019
Power supply system2017
Manufacturing method of semiconductor device2016
Power supply system for vehicle2016
Electric power supply system2016
Semiconductor device and manufacturing method therefor2016
Light source driving device, light source driving method, and image display devi2016
Semiconductor device and manufacturing method therefor2015
Method for forming bumps, semiconductor device and method for manufacturing same2015
Electronic component bonding method2014