Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5831441 | Test board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor device | Toshiyuki Motooka, Tatsuharu Matsuda, Kunio Kodama, Joji Fujimori, Shigeki Harada +3 more | 1998-11-03 |