Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks

Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks

US Patent 4503386 · Granted Mar 5, 1985

Estimated economic value: $15,799,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Resistance training apparatus and methods2013
Systems and methods for functional training exercises having function-specific u2012
Functional training exercise apparatus and methods2011
Dynamically reconfigurable shared scan-in test architecture2011
Dynamically reconfigurable shared scan-in test architecture2010
Dynamically reconfigurable shared scan-in test architecture2010
Scan compression circuit and method of design therefor2010
Dynamically reconfigurable shared scan-in test architecture2010
Dynamically reconfigurable shared scan-in test architecture2010
Method and apparatus for limiting power dissipation in test2010
Dynamically reconfigurable shared scan-in test architecture2009
Golf club style functional training handle for exercise machines2008