Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of testing wafer

Method of testing wafer

US Patent 12009302 · Granted Jun 11, 2024

Estimated economic value: $12,601,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device and method of manufacturing the same2025
Semiconductor device having non-continuous wall structure surrounding a stacked 2025
MOSFET device structure with air-gaps in spacer and methods for forming the same2025
Semiconductor arrangement with airgap and method of forming2025
Semiconductor wafer with devices having different top layer thicknesses2025
Reducing RC delay in semiconductor devices2025
Semiconductor structure and method for manufacturing the same2025
Semiconductor structure and method for manufacturing the same2025
Method of manufacturing a metal-oxide-semiconductor field-effect transistor (MOS2025
Semiconductor device with air-void in spacer2024
Source/drain epitaxial layer profile2024
Semiconductor device having a wall structure surrounding a stacked gate structur2024