Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12009302 | Method of testing wafer | Chia-Yi Tseng, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2024-06-11 |
| 11430733 | Method of testing wafer | Chia-Yi Tseng, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2022-08-30 |
| 10818595 | Semiconductor structure, testing and fabricating methods thereof | Chia-Yi Tseng, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2020-10-27 |
| 10037927 | Semiconductor structure, testing and fabricating method thereof | Chia-Yi Tseng, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2018-07-31 |
| 9478578 | Stress release layout and associated methods and devices | Chi-Cherng Jeng, Chun-Hao Chou, Tsung-Han Tsai, Kuo-Cheng Lee, Volume Chien +1 more | 2016-10-25 |
| 9196642 | Stress release layout and associated methods and devices | Tsung-Han Tsai, Allen Tseng, Chun-Hao Chou, Kuo-Cheng Lee, Volume Chien +1 more | 2015-11-24 |
| 8652868 | Implanting method for forming photodiode | Yu-Shen Shih, Ching-Hwanq Su, Wei-Ming You, Chih-Cherng Jeng, Kuo-Cheng Lee | 2014-02-18 |