Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12009302 | Method of testing wafer | Yen-Hsung Ho, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2024-06-11 |
| 11430733 | Method of testing wafer | Yen-Hsung Ho, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2022-08-30 |
| 10818595 | Semiconductor structure, testing and fabricating methods thereof | Yen-Hsung Ho, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2020-10-27 |
| 10672777 | Method of manufacturing semiconductor device having multi-height structure | Kuan-Wei Su, Yung-Lung Hsu, Chih-Hsun Lin, Kun-Tsang Chuang, Chiang-Ming Chuang | 2020-06-02 |
| 10211214 | Semiconductor device having milti-height structure and method of manufacturing the same | Kuan-Wei Su, Yung-Lung Hsu, Chih-Hsun Lin, Kun-Tsang Chuang, Chiang-Ming Chuang | 2019-02-19 |
| 10037927 | Semiconductor structure, testing and fabricating method thereof | Yen-Hsung Ho, Chih-Hsun Lin, Kun-Tsang Chuang, Yung-Lung Hsu | 2018-07-31 |