Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › In-line monitoring of OLED layer thickness and dopant concentration

In-line monitoring of OLED layer thickness and dopant concentration

US Patent 11856833 · Granted Dec 26, 2023

Estimated economic value: $30,871,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

In-situ reflectometry for real-time process control2025
High quality quantum computer components2025
Deposition of silicon-based dielectric films2025
Reflective waveplates for pupil polarization filtering2025
SNSPD with integrated aluminum nitride seed or waveguide layer2025
Encapsulation materials for flat optical devices2025
Image based metrology of surface deformations2025
System and method to map thickness variations of substrates in manufacturing sys2025
Method of enhancing contrast while imaging high aspect ratio structures in elect2025
Autonomous substrate processing system2025
Micro-LED displays to reduce subpixel crosstalk2025
Manufacturing micro-LED displays to reduce subpixel crosstalk2025