Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12225808 | In-line monitoring of OLED layer thickness and dopant concentration | Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd Egan +1 more | 2025-02-11 |
| 12137601 | In-line monitoring of OLED layer thickness and dopant concentration | Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Dinesh Kabra | 2024-11-05 |
| 11927535 | Metrology for OLED manufacturing using photoluminescence spectroscopy | Avishek Ghosh, Byung Sung Kwak, Todd Egan, Robert Jan Visser, Dinesh Kabra | 2024-03-12 |
| 11889740 | In-line monitoring of OLED layer thickness and dopant concentration | Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Dinesh Kabra | 2024-01-30 |
| 11856833 | In-line monitoring of OLED layer thickness and dopant concentration | Yeishin Tung, Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd Egan +1 more | 2023-12-26 |
| 11662317 | Metrology for OLED manufacturing using photoluminescence spectroscopy | Avishek Ghosh, Byung Sung Kwak, Todd Egan, Robert Jan Visser, Dinesh Kabra | 2023-05-30 |
| 10935492 | Metrology for OLED manufacturing using photoluminescence spectroscopy | Avishek Ghosh, Byung Sung Kwak, Todd Egan, Robert Jan Visser, Dinesh Kabra | 2021-03-02 |