Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12225808 | In-line monitoring of OLED layer thickness and dopant concentration | Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd Egan, Dinesh Kabra +1 more | 2025-02-11 |
| 12163783 | Digital holography for alignment in layer deposition | Byung Sung Kwak, Robert Jan Visser | 2024-12-10 |
| 12137601 | In-line monitoring of OLED layer thickness and dopant concentration | Byung Sung Kwak, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra | 2024-11-05 |
| 11889740 | In-line monitoring of OLED layer thickness and dopant concentration | Byung Sung Kwak, Robert Jan Visser, Gangadhar Banappanavar, Dinesh Kabra | 2024-01-30 |
| 11856833 | In-line monitoring of OLED layer thickness and dopant concentration | Byung Sung Kwak, Robert Jan Visser, Guoheng Zhao, Todd Egan, Dinesh Kabra +1 more | 2023-12-26 |
| 6777676 | Non-destructive root cause analysis on blocked contact or via | Ying Wang, Anne Testoni | 2004-08-17 |