Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Visualization of three-dimensional semiconductor structures

Visualization of three-dimensional semiconductor structures

US Patent 11099137 · Granted Aug 24, 2021

Estimated economic value: $209,661,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Metrology in the presence of CMOS under array (CuA) structures utilizing an effe2025
Optical and X-ray metrology methods for patterned semiconductor structures with 2025
Optical and X-ray metrology methods for patterned semiconductor structures with 2025
Forward library based seeding for efficient X-ray scatterometry measurements2025
Electrical connector assembly with improved terminals2025
Methods and systems for measurement of semiconductor structures with multi-pass 2025
Metrology of nanosheet surface roughness and profile2025
Metrology in the presence of CMOS under array (CuA) structures utilizing machine2025
Battery charging box2025
Metrology in the presence of CMOS under array (CUA) structures utilizing an effe2025
Methods and systems for regularizing the optimization of application specific se2025
Full beam metrology for x-ray scatterometry systems2025